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| - Chip Inspection
& Taping M/C |
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Product
Feature |
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- Gauged Value of L¡¢Q
and R Within Index Disk - Classify Good &
NG
- Analyzer£ºThe Newest Hewlett Packard Analyzer
- Adhere to Cover Seal by Using Hot Press wire Bonding
then Roll
Winding
* High Speed Automatic Winder for Measurement, Packing
and Gauge
- T/Time £º300pcs/min
- Gauge £ºRac, LQ or Z¥è
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